EMBL Conference
Sixth International Congress on Electron Tomography
EMBL Heidelberg, Germany Thursday 5 May - Sunday 8 May 2011
FEI Workshop
Electron Tomography Workflow: From Sample Preparation Through Visualization
Venue: EMBL Advanced Training Centre, Courtyard Seminar Room
To register for this workshop, please click here. Onsite registration will take place on Thursday 5 May from 12 :00 - 13:00. A light lunch will be available during this time.
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Latest Developments in 3D Imaging |
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Wim Voorhout, Cellular Biology Solutions
The desire to understand the 3D relationships of mesoscale hierarchies has led to the development of advanced microscopy techniques. A focused ion beam (FIB) can be used as an alternative for serial section TEM, where the FIB acts as a nano scalpel to allow ultrathin sections down to 5-10 nm and revealing the internal microstructure in a site-specific manner. Scanning Electron Microscopy (SEM) and FIB technologies have now been brought together into a single instrument representing a powerful combination for the study of biological specimens and soft materials. We demonstrate the use of FIB-SEM to study 3D relationships of cellular structure volumes up to several cells.
- Break and Discussion - |
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Latest Developments Electron Tomography Data Analysis |
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Remco Schoenmakers, Senior Software Scientist
FEI, as a total solution provider, is covering the electron tomography workflow from sample preparation (Vitrobot), through acquisition (Xplore3D), alignment and reconstruction (Inspect3D), analysis through 3D template matching and sub-tomogram averaging (ARGOS), and visualization (ResolveRT). During this workshop we will focus on the data analysis step and discuss the algorithms, features and highlights of Inspect3D and ARGOS. The workshop will include live previews of the development versions of Inspect3D and ARGOS. |
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Cowpea Mosaic Virus (CPMV) with x-ray coordinate |
Tubes of gp23 from bacteriophage T4 |
Template matching of vitrified KLH structure |

