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This course will teach theory and practice for high-accuracy correlative light and electron microscopy. Students will learn high-accuracy CLEM on resin embedded samples using SEM approaches (Peddie et al. 2014) as well as using TEM according to the procedures developed in the Briggs group at EMBL (Kukulski et al. 2011). The course will also cover the extension of this approach to cryo-EM specimens (Schorb and Briggs 2014), and more recently developed equipment and work flows for cryo-CLEM.
People with experience in EM who want to further develop their skills in high-accuracy correlated microscopy.
The course will combine lectures and hands-on practical work covering all steps in the work flow: sample preparation, microscopy, and image registration/analysis.
Getting hands-on experience of the CLEM methods and tips from the people who developed the methods.